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Search for "low-kV imaging" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials
Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158
- chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms. Keywords: TEM; aberration-corrected; carbon; nanostructures; low-kV imaging; Review 1
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